TY  - BOOK
AU  - NBS/RADL Workshop (1980
AU  - Cohen, Elaine C., ed.
AU  - Ruthberg, Stanley., ed.
TI  - Moisture measurement technology for haemetic semiconductor devices II
T2  - National Bureau of Standards Special Publications 400-72
U1  - 621.38152 
PY  - 1982///
CY  - Washington
PB  - National Bureau of Standards
ER  -