NBS/RADL Workshop (1980  Gaithersburg, MD) <br/><br/>
Moisture measurement technology for haemetic semiconductor devices II   
ed. by Elaine C.Cohen, Stanley Ruthberg 
 - Washington  National Bureau of Standards  1982 
 - vi, 294p. 
 - National Bureau of Standards Special Publications 400-72 .
<br/><br/><label>Dewey Class. No.: </label>621.38152  / N822.2