Fultz, B. <br/><br/>
Transmission electron microscopy and diffractometry of materials   
by B Fultz and J M Howe 
 - 2nd ed. 
 - Berlin  Springer  2002 
 - xxi,748p. 
<br/><br/><label>ISBN: </label>3540437649 
<br/><br/><label>Dewey Class. No.: </label>620.5015430858  / P02;1