TY  - BOOK
TI  - Proceedings of the 1994 IEEE international conference on microelectronic test structures
SN  - 0780317580
U1  - 621.381 
PY  - 1994///
CY  - California
PB  - Institute of electrical and electronics engineers, Inc.
KW  - Microelectronics
KW  - Microelectronic circuits
ER  -