Proceedings of the 1994 IEEE international conference on microelectronic test structures 

 - California:  Institute of electrical and electronics engineers, Inc.,  1994. 
 - xi, 224p.;  ill.;  28 cm. 
<br/><br/><label>ISBN: </label>0780317580 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics<br/>Microelectronic circuits
<br/><br/><label>Dewey Class. No.: </label>621.381  / MIC