TY  - BOOK
AU  - Rogers George J.
AU  - Sawyer, David E.
AU  - Jesch, Raman L.
TI  - Semiconductor measurement technology: measurement of transistors scattering parameters
T2  - National Bureau of Standards Special Publications
U1  - 621.381528 
PY  - 1976///
CY  - Washington
PB  - W B S
ER  -