TY  - BOOK
AU  - Sonawane, Dipali
TI  - Mechanical reliability of metal-Si systems at different length scales under thermal cyclic loading
U1  - 620 
PY  - 2020///
CY  - Bengaluru
PB  - IISc
KW  - Materials Engineering
KW  - Mechanical Reliability
KW  - Structural Integrity
KW  - Finite Element Analysis
KW  - Microelectronics
N1  - include bibliographical reference and index; PhD; IISc; 2020
ER  -