TY  - BOOK
AU  - Ansh
TI  - Disruptive approaches to address performance & reliability challenges in 2-dimentional (2D) material based transistors & memories
U1  - 621 
PY  - 2021///
CY  - Bengaluru
PB  - IISc
KW  - transition metal dichalcogenides
KW  - field effect transistors
KW  - contact engineering
KW  - CMOS applications
KW  - long-term electrical reliability
N1  - include bibliographical reference and index; PhD; IISc; 2021
ER  -