TY  - BOOK
AU  - Schroder, Dieter K
TI  - Semiconductor material and device characterization
SN  - 9780471749080 
PY  - 2006///
CY  - Hoboken
PB  - John Wiley & Sons, Inc.
KW  - Semiconductors
KW  - Semiconductors -- Testing
N1  - Includes bibliographical references and index
ER  -