Schroder, Dieter K   <br/><br/>
Semiconductor material and device characterization   
by Dieter K Schroder 
 - 3rd ed. 
 - Hoboken  John Wiley & Sons, Inc.  2006 
 - xv, 779p.     
<br/><br/> Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780471749080  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Semiconductors -- Testing.