TY  - BOOK
AU  - Pietsch, Ullrich
AU  - Holy, Vaclav
AU  - Baumbach, Tilo
TI  - High-resolution X-Ray scattering: From thin films to lateral nanostructures
SN  - 9780387400921
U1  - 530.4175 
PY  - 2004///
CY  - New York
PB  - Springer
ER  -