Egerton, R. F. <br/><br/>
Physical principles of electron microscopy : An introduction to TEM, SEM, and AEM 
by R F Egerton 
 - 2nd ed 
 - Switzerland  Springer  2016 
 - xi, 196p. 
<br/><br/><label>ISBN: </label>9783319398761 
<br/><br/><label>Dewey Class. No.: </label>502.825  / P161