Yield modelling and defect tolerance in VLSI 
ed by Will Moore, Wojciech Maly and Andrzej Strojwas 
 - Philadelphia  Adam hilger  1988 
 - vi, 282p. 
<br/><br/><label>ISBN: </label>085274398X 
<br/><br/><label>Dewey Class. No.: </label>621.38173  / N8829