IEEE International symposium on electromagnetic compatibility (1995  Atlanta) <br/><br/>
Electromagnetic compatability. EMC- a global concern: Symposium record 

 - New Jersey  IEEE  1995 
<br/><br/><label>ISBN: </label>0780325745 
<br/><br/><label>Dewey Class. No.: </label>621.306  / N95 "SERIES"