Microelectronic test structures. ICMTS 1995. Proceedings 

 - New Jersey  IEEE  1995 
 - xii,304p.  incl.bibl. 
<br/><br/><label>ISBN: </label>0780320662 
<br/><br/><label>Dewey Class. No.: </label>621.381548  / N95 "SER"