Haugstad, Greg   <br/><br/>
Atomic force microscopy  Understanding basic modes and advanced applications 

 - New Jersey  Wiley  2012 
 - xxii, 464p. 
<br/><br/><label>ISBN: </label>9780470638828 
<br/><br/><label>Dewey Class. No.: </label>620.5  / P1210 (ME)