TY  - BOOK
AU  - International symposium on VLSI design and test(17
AU  - Manoj, ed.
TI  - VLSI design and test
T2  - Communication in computer and information science
SN  - 9783642420238
U1  - 621.395 
PY  - 2013///
CY  - New York
PB  - Springer
ER  -