Goldstein, Joseph I <br/><br/>
Scanning Electron Microscopy and X-ray Microanalysis 
by by Joseph I Goldstein., et al 
 - 3rd ed 
 - New York  Springer  2003 
 - xix, 690p. 
<br/><br/> Including CD 
<br/><br/><label>ISBN: </label>9780306472923 
<br/><br/><label>Dewey Class. No.: </label>502.825  / P03;4 (CeNSE)