Iberoamericann Congress 2007) Chile CIARP (12 Progress in Pattern Recognition, Image Analysis and Applications [electronic resource] Proceedings by Luis Rueda, Domingo Mery and Josef Kittler - Berlin Springer 2007 http://dx.doi.org/10.1007/978-3-540-76725-1 ISBN: 9783540767251 Dewey Class. No.: 006.4 / (e-book)