TY  - BOOK
AU  - Chiang, Charles C.
AU  - Kawa, Jamil.
TI  - Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource]
SN  - 9781402051883
U1  - 621.38152042 
PY  - 2007///
CY  - Dordrecht
PB  - Springer
N1  - http://dx.doi.org/10.1007/978-1-4020-5188-3
ER  -