TY  - BOOK
AU  - Sachdev, Manoj.
AU  - Gyvez, Jos़ Pineda de.
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource]
SN  - 0387465472
U1  - 621.395 
PY  - 2007///
CY  - Boston
PB  - Springer
N1  - http://dx.doi.org/10.1007/0-387-46547-2
ER  -