Sachdev, Manoj. <br/><br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource]   
by Manoj Sachdev and Jos़ Pineda de Gyvez 
 - Boston  Springer  2007 
<br/><br/> http://dx.doi.org/10.1007/0-387-46547-2 
<br/><br/><label>ISBN: </label>0387465472 
<br/><br/><label>Dewey Class. No.: </label>621.395  / (e-book)