Bora, Achyut <br/><br/>
Investigation of damage process in current stressed metal film using noise spectroscopy, scanning thermal microscopy and simulation studies 
by Achyut Bora 
 - Bangalore :  Indian Institute of Science,  2007. 
 - xxiv, 222 p. :  col. ill. 
<br/><br/> Include CD and bibliography. 
<br/><br/>PhD;2007;Physics. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal thin film<br/>Spectroscopy<br/>Thermal Microscopy
<br/><br/><label>Dewey Class. No.: </label>530.4175  / P07