International conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007  Gaithersburg) <br/><br/>
Frontiers of Characterization and Metrology for Nanoelectronics   
ed by David G. Seiler, et al., 
 - Melville  American Institute of Physics  2007 
 - xiii, 578p.  incl. bibl. 
 - AIP Conference Proceedings. Vol.931 .
<br/><br/> CD-ROM INCLUDED 
<br/><br/><label>ISBN: </label>9780735404410 
<br/><br/><label>Dewey Class. No.: </label>621.3815  / P07