Nicolici, Nicola  Al-Hashimi, Bashir <br/><br/>
Power-Constrained Testing of VLSI Circuits   

 -  Kluwer Academic Publishers 
 - 2003. 191 Pages 
<br/><br/><label>ISBN: </label>140207235X 
<br/><br/><label>Dewey Class. No.: </label>circuits  / -- Very large scale integration -- Protection., 621.39/5/0287