IEEE AUTOTESTCON 2005 (2005  Orlando) <br/><br/>
Technology powering the next generation of test. AUTOTESTCON 2005. Conference   

 - Piscataway  IEEE  2005 
 - xxvii, 867p.  incl. bibl. 
<br/><br/><label>ISBN: </label>0780391012 
<br/><br/><label>Dewey Class. No.: </label>621.38154806  / P05 "SER"