Cherns, David. <br/><br/>
Evaluation of advanced simeconductor materials by electron microscopy /ed. by David Cherns   

 - New York  Plenum  1989 
 - 424p 
 - NATO ASI Series  Advanced Science Institute Series  Series B: Physics  V.203 .
<br/><br/><label>ISBN: </label>030643363X 
<br/><br/><label>Subjects--Index Terms: </label>Semiconductors Electron microscopy 
<br/><br/><label>Dewey Class. No.: </label>621.381532  / N89