TY  - BOOK
AU  - Spaeth, J M
AU  - Overhof, H
TI  - Point defects in semiconductors and insulators: Determination of Atomic and Electronic structure from Paramagnetic Hyperfine Interactions
T2  - Springer series in Materials Science
SN  - 3540426957
U1  - 621.38152 
PY  - 2003///
CY  - Berlin
PB  - Springer-Verlag
ER  -