TY  - BOOK
AU  - IEEE International conference on wafer scale integration. (2
AU  - Brewer, Joe. Little, Michael J.
TI  - conference on wafer scale integration. Proceedings /ed. by Joe Brewer, Michael J. Little
SN  - 0818690136
U1  - 621.395 
PY  - 1990///
CY  - New York
PB  - IEEE
ER  -