IEEE International conference on microelectronic test structures (3  1990  San Diego) <br/><br/>
Microelectronic test structures. ICMTS 1990. Proceedings.   

 - New York  IEEE  1990 
 - x, 244p  incl. bibl. 
<br/><br/><label>Dewey Class. No.: </label>621.381548  / N901 "SER"