TY  - BOOK
AU  - Saxena, Prashant Kumar
TI  - Single event upset in SRAM for the deep sub-micron CMOS technology
T2  - IISc, Dept of ECE, MSc (Engg) Thesis
U1  - 621.39732 
PY  - 2002///
CY  - Bangalore
PB  - Indiand Institute of Science
ER  -