Goldstein, Joseph I. <br/><br/>
Scanning electron microscopy and X-Ray microanalysis   
by Joseph I. Goldstein, etal. 
 - 3rd ed. 
 - New York  Kluwer Academic/Plenum Publishers  2003 
 - xix, 689p. 
<br/><br/> Includes CD-ROM 
<br/><br/><label>ISBN: </label>0306472929 
<br/><br/><label>Dewey Class. No.: </label>502.825  / P03