Microelectronics test structures. ICMTS 1992  Proceedings 

 - New York  IEEE  1992 
 - xi, 214p  incl. bibl. 
<br/><br/><label>ISBN: </label>0780305361 
<br/><br/><label>Subjects--Index Terms: </label>ICMTS 1992; Microelectronics; IEEE Electron Devices Society 
<br/><br/><label>Dewey Class. No.: </label>621.381548  / N92 "SER"