IEEE International conference on microelectronic test structures (13  2000  Monterey) <br/><br/>
Microelectronic test structures. ICMTS 2000  Proceedings. 

 - Piscataway  IEEE  2000 
 - 251p.  incl. bibl., 
<br/><br/><label>ISBN: </label>0780362764 
<br/><br/><label>Dewey Class. No.: </label>621.381548  / P2 "SER"