TY  - BOOK
AU  - Intl. conf. held at New York, 1959
AU  - Neugebaner, C.A., [et al] ed.
TI  - Structure and properties of thin films
U1  - 530.4106 
PY  - 1959///
CY  - New York
PB  - John Wiley and sons, Inc.
ER  -