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VLSI reliability. by G. Anant Sabnis.

By: Material type: TextTextSeries: VLSI electronics microstructure science, 22Publication details: San Diego AP 1990Description: xi, 207pISBN:
  • 0122341228
Subject(s): DDC classification:
  • 621.395 N906
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Item type Current library Call number Status Date due Barcode
Book Book JRD Tata Memorial Library 621.395 N906 (Browse shelf(Opens below)) Available 145820

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