Improved infrared response technique for detecting deflects and impurities in germanium and silicon p-1-n diodes by A. H. Sher.

By: Material type: BookBookSeries: National Bureau of Standards Special Publication ; 400-13Publication details: Washington NBS 1975Description: iv, 20pSubject(s): DDC classification:
  • 621.381522 N75
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Item type Current library Call number Status Date due Barcode
Reference Reference JRD Tata Memorial Library 621.381522 N75 (Browse shelf(Opens below)) Available 87161

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