Image from Amazon.com
Experimental techniques for low temperature measurements : Cryostat design, material properties and superconductor critical-current testing by Jack W Ekin
Material type:
TextPublication details: Oxford OUP 2006Description: xxvii, 673pISBN: - 9780198570547
- 536.54 P06 (IAP)
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
Book
|
Instrumentation and Applied Physics | 536.54 P06 (IAP) (Browse shelf(Opens below)) | Available | CP2281 |
Browsing Instrumentation and Applied Physics shelves Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 535.324 P09 (ISU) Physics and Applications of Negative Refractive Index Materials | 535.42 P07;1 (ISU) Diffraction Fourier optics and imaging | 535.842 P07;1 (ISU) Fourier Transform Infrared Spectrometry | 536.54 P06 (IAP) Experimental techniques for low temperature measurements : Cryostat design, material properties and superconductor critical-current testing | 537.6 N99;7 (IAP) Classical electrodynamics | 537.622 P151 (IAP) Physics of semiconductor devices | 537.623 N96;7 (IAP) Introduction to superconductivity |
There are no comments on this title.
Log in to your account to post a comment.
