Fundamentals of Modern VLSI Devices by Yuan Taur and Tak H Ning
Material type:![Book](/opac-tmpl/lib/famfamfam/BK.png)
- 9780521540858
- 621.395 P037 (ECE)
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
![]() |
Electrical Communication Engineering | 621.395 P037 (ECE) (Browse shelf(Opens below)) | Available | 192680 |
Browsing Electrical Communication Engineering shelves Close shelf browser (Hides shelf browser)
![]() |
![]() |
![]() |
![]() |
![]() |
![]() |
![]() |
||
621.395 P Silicon VLSI technology | 621.395 P002;1 (ECE) Essentials of Electronic Testing for Digital, Memory,and Mixed-Signal VLSI Circuits | 621.395 P036 (ECE) IEEE standard for in-system configuration of programmable devices | 621.395 P037 (ECE) Fundamentals of Modern VLSI Devices | 621.395 P0511 (ECE) Analysis and design of digital Integrated circuits In Deep Submicron Technology | 621.395 P094;1 (ECE) Silicon VLSI Technology Fundamentals, Practice and Modeling | 621.395 P094;5 (ECE) Silicon VLSI Technology: Fundamentals, Practice and Modeling |
There are no comments on this title.