Scanning Electron Microscopy and X-ray Microanalysis by by Joseph I Goldstein., et al

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TextPublication details: New York Springer 2003Edition: 3rd edDescription: xix, 690pISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Book	Centre for Nano Science and Engineering	502.825 P03;4 (CeNSE) (Browse shelf(Opens below))	Available		191899

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