Yield and variability optimization of integrated circuits by J. C. Zhang and M. A. Styblinski

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Material type: Text

TextPublication details: Boston Kluwer Acadamic 1995Description: xv,234pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	Electrical Communication Engineering	621.3815 N957 (Browse shelf(Opens below))	Available		172835

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