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Study of the source-substrate geometry to achieve thickness uniformity of thin films T.S. Radha Bai

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Material type: Text

TextPublication details: Bangalore : Indian Institute of Science, 1987.Description: viii, 77 p. : illSubject(s):

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Dissertation note: MSc(Eng);1987;Instrumentation and Services Unit.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Thesis	JRD Tata Memorial Library	530.41 N87 (Browse shelf(Opens below))	Not for loan		T02478

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Previous	530.41 N77 Theoretical study on localization and transport in disordered systems	530.41 N79 Superconducting electron pairing in the presence of a rodiation field	530.41 N85 Investigations of solids and surfaces by techniques of electron spectroscopy	530.41 N87 Study of the source-substrate geometry to achieve thickness uniformity of thin films	530.41 N88 Influence of deposition parameters on the optical properties of t1,o2 and s1 o2 films	530.41 N89 Some aspects of synthesis, structure and stability of quasicrystals.	530.41 N90 Solids with crystallographically forbidden symmetries : periodic tilings and quasi crystals.	Next

Includes references.

MSc(Eng);1987;Instrumentation and Services Unit.

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