Self-testing VLSI design (Record no. 6978)

MARC details
000 -LEADER
fixed length control field 00604nam a2200193Ia 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0444896406
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Item number N93
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name by V.N. Yarmolik and I.V. Kachan
110 ## - MAIN ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element Yarmolik, V.N.
245 ## - TITLE STATEMENT
Title Self-testing VLSI design
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Amsterdam
Name of publisher, distributor, etc. Elsevier
Date of publication, distribution, etc. 1993
300 ## - PHYSICAL DESCRIPTION
Extent xi, 345p.
690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN)
Topical term or geographic name as entry element Integrated circuits - Very Large Scale Integ.
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Kachan, I.V
919 ## -
-- 006980
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Koha item type
        Supercomputer Education and Research Centre Supercomputer Education and Research Centre Supercomputer Education and Research Centre 24/05/1996   621.395 N93 151546 Reference

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