Moisture measurement technology for haemetic semiconductor devices II (Record no. 66860)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | N822.2 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | NBS/RADL Workshop (1980 |
| Numeration | Gaithersburg, MD) |
| 245 ## - TITLE STATEMENT | |
| Title | Moisture measurement technology for haemetic semiconductor devices II |
| Remainder of title | |
| Statement of responsibility, etc. | ed. by Elaine C.Cohen, Stanley Ruthberg |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Washington |
| Name of publisher, distributor, etc. | National Bureau of Standards |
| Date of publication, distribution, etc. | 1982 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | vi, 294p. |
| 490 ## - SERIES STATEMENT | |
| Series statement | National Bureau of Standards Special Publications 400-72 |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Measurement technology - Hermetic Semiconductor technology |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Cohen, Elaine C., ed. |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Ruthberg, Stanley., ed. |
| 919 ## - | |
| -- | 069229 |
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