Microelectronic test structure. ICMTS 1968. proceedings (Record no. 29126)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381706 |
| Item number | N68 "SER" |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | IEEE International conference on microelectronic test structure (1968 |
| Numeration | St. Louis) |
| 245 ## - TITLE STATEMENT | |
| Title | Microelectronic test structure. ICMTS 1968. proceedings |
| Remainder of title | |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | St. Louis, USA |
| Name of publisher, distributor, etc. | IEEE |
| Date of publication, distribution, etc. | 1968 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | sectional |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Microelectronics; ICMTS 1968; IEEE electron devices society |
| 919 ## - | |
| -- | 030749 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| JRD Tata Memorial Library | JRD Tata Memorial Library | 14/04/1997 | 621.381706 N68 "SER" | 56832 | Reference |
