Digital Systems Testing and Testable Design (Record no. 181630)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9788172248918 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815 |
| Item number | P0112 (DESE) |
| 245 ## - TITLE STATEMENT | |
| Title | Digital Systems Testing and Testable Design |
| Remainder of title | |
| Statement of responsibility, etc. | ed by Miron Abramovici Melvin Breuer and Arthur Friedman |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Mumbai |
| Name of publisher, distributor, etc. | JAICO Publishing House |
| Date of publication, distribution, etc. | 2001 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xviii, 652p. |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Digital Integrated Circuits; |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Abramovici, Miron., ed |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Breuer, Melvin., ed |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Friedman, Arthur., ed |
| 919 ## - | |
| -- | 194251 |
| 964 ## - | |
| -- | |
| -- | |
| -- | |
| -- | |
| -- | |
| -- | |
| -- | DESE |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Electronic Systems Engineering | Electronic Systems Engineering | 24/03/2014 | 599.00 | 621.3815 P0112 (DESE) | 192582 | Book |
