Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] (Record no. 174099)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781402051883 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152042 |
| Item number | (e-book) |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Chiang, Charles C. |
| 245 ## - TITLE STATEMENT | |
| Title | Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] |
| Remainder of title | |
| Statement of responsibility, etc. | by Charles C Chiang and Jamil Kawa |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Dordrecht |
| Name of publisher, distributor, etc. | Springer |
| Date of publication, distribution, etc. | 2007 |
| 500 ## - GENERAL NOTE | |
| General note | http://dx.doi.org/10.1007/978-1-4020-5188-3 |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Computer aided design; Nanotechnology; Electronics and Microelectronics, Instrumentation; Computer-Aided Engineering (CAD, CAE) and Design; Software Engineering/Programming and Operating Systems |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Kawa, Jamil. |
| 919 ## - | |
| -- | 186671 |
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