Semiconductor thermal and temperature measurement. Proceedings. (Record no. 14375)
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| fixed length control field | 00604nam a2200193Ia 4500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3841340287 |
| Item number | N90 "SER" |
| 245 ## - TITLE STATEMENT | |
| Title | Semiconductor thermal and temperature measurement. Proceedings. |
| Remainder of title | |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | IEEE |
| Date of publication, distribution, etc. | 1990 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv, 146p |
| Other physical details | incl. bibl. |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Semiconductors -Thermal properties; IEEE Components,hybrids & manufacturing Technology Society |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | IEEE Symposium on semiconductor thermal and temperature measurement (6: 1990: Scottsdale) |
| 919 ## - | |
| -- | 014640 |
| 964 ## - | |
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| -- | 0 |
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| -- | 6TH. |
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