Single event upset in SRAM for the deep sub-micron CMOS technology (Record no. 136372)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39732 |
| Item number | P02 "THESIS" |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Saxena, Prashant Kumar |
| 245 ## - TITLE STATEMENT | |
| Title | Single event upset in SRAM for the deep sub-micron CMOS technology |
| Remainder of title | |
| Statement of responsibility, etc. | by Prashant Kumar Saxena |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Bangalore |
| Name of publisher, distributor, etc. | Indiand Institute of Science |
| Date of publication, distribution, etc. | 2002 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xi, 67p |
| 490 ## - SERIES STATEMENT | |
| Series statement | IISc, Dept of ECE, MSc (Engg) Thesis |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Data Storage; Metal Oxide Semiconductors; SRAM |
| 919 ## - | |
| -- | 141666 |
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