Semiconductor thermal and temperature measurement.Proceedings (Record no. 134269)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00604nam a2200193Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0780373278 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | P023 "SER" |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | IEEE Symposium on semiconductor thermal and temperature measurement (8 |
| Numeration | San Jose |
| -- | 2002) |
| 245 ## - TITLE STATEMENT | |
| Title | Semiconductor thermal and temperature measurement.Proceedings |
| Remainder of title | |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Piscataway |
| Name of publisher, distributor, etc. | IEEE |
| Date of publication, distribution, etc. | 2002 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xii, 196p. |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | Semiconductors; Solid state electronics; Power semiconductorsl; Semiconducotr- thermal properties; IEEE components, hybrids and manufacturing technology society |
| 919 ## - | |
| -- | 139545 |
| 904 ## - LOCAL DATA ELEMENT D, LDD (RLIN) | |
| a | Semi-therm proceedings 2002 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| JRD Tata Memorial Library | JRD Tata Memorial Library | 21/06/2002 | 621.38152 P023 "SER" | G16651 | Book |
